Maiga A, Bonnaud O, Rolland L, Taurin M. Determination of the origin of failure mechanism involved in the degradation of the threshold voltage of a PMOS FET associated to a lateral PNP bipolar transistor in a I2L test cells . JSPI [Internet]. 29 oct. 2008 [cité 23 nov. 2024];8. Disponible sur: http://webtest.ucad.sn/JSPI/index.php/jspi/article/view/8